| Judul | Accelerated Testing Statistical Models, Test Plans, and Data Analysis Wayne Nelson |
| Pengarang | Nelson, Wayne |
| Penerbitan | John Wiley and Sons, 2004 |
| Deskripsi Fisik | xiv., 601 hlm., ill.23 cm. |
| ISBN | 978-0-471-69736-7 |
| Subjek | MODEL STATISTIK |
| Bahasa | Inggris |
| Target Pembaca | Tidak diketahui / tidak ditentukan |
| No Barcode | No. Panggil | Akses | Lokasi | Ketersediaan |
|---|---|---|---|---|
| 1806101822 | 519.5 Nel a 1 | Dapat dipinjam | Ruang Baca Fakultas Sains dan Teknologi - RBU FST Koleksi Umum |
Tersedia
pesan |
| Tag | Ind1 | Ind2 | Isi |
| 001 | INLIS000000000096263 | ||
| 008 | # | # | ###################################eng## |
| 020 | # | # | $a 978-0-471-69736-7 |
| 035 | # | # | $a 0010-0118011218 |
| 082 | # | # | $a 519.5 |
| 084 | # | # | $a |
| 100 | # | # | $a Nelson, Wayne |
| 245 | # | # | $a Accelerated Testing Statistical Models, Test Plans, and Data Analysis / $c Wayne Nelson |
| 260 | # | # | $b John Wiley and Sons, $c 2004 |
| 300 | # | # | $a xiv., 601 hlm., ill. ; $c 23 cm. |
| 650 | # | # | $a MODEL STATISTIK |
| 990 | # | # | $a 1806101822 |
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